Characterization of MOSFET Response to the Xoft Axxent (TM) X-ray Brachytherapy Source
| Title: | Characterization of MOSFET Response to the Xoft Axxent (TM) X-ray Brachytherapy Source |
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| Authors: | Steve Axelrod, PhD and Thomas W. Rush, PhD. Xoft Inc., Fremont, CA |
| Presenter: | Axelrod Steve - Contact |
| Category: | Technology |
| Language: | English |
| Download link: | View this poster |
| Date of Validation: | 2008-04-28 |